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ACCESS™ Probes |
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AppNano ACCESS™ probes are sharp silicon probes that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. |
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| Tip Specifications |
| Material: Silicon |
| Shape: Triangular Pyramid |
| Height (µm): 14-16 |
| ROC * (nm): 6 |
| * Nominal specification; guaranteed < 10 nm |
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| Cantilever Specifications |
| Material: Silicon |
| Shape: Rectangular |
| L x W x T: 3.4 mm x 1.6 mm x 300 um |
| Reflex Coating: None |
| Alignment Grooves: YES |
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ACCESS.pdf |
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Available Models:
- ACCESS-NC: Standard Non-Contact/Tapping Mode probe, uncoated
- ACCESS-FM: Standard probe for Force Modulation
- ACCESS-EFM: Pt-Ir coated probe for Electric Force Mode Applications
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| For further information or to place an order, please contact your local distributor or contact Applied NanoStructures directly |
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