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	Applied NanoStructures provide an assortment of high aspect ratio probes for trench depth measurements with different tilt compensation.   These probes can be used for both process characterization and monitoring.  We carry various probes design to meet the needs of the semiconductor industry up to the 45nm technology node.  The different tilt compensation angle is design to fit to multiple AFM systems.  If none of these probes meet your requirements, please contact us and we will be happy to modify our products to suit your needs.
	No Tilt Compensation	3 Degree Tilt Compensation	12 Degree Tilt Compensation
	Specifications	Specifications	Specifications
	For quote or more information please fill out this info request form. (Info Form)