| Electrostatic Force Microscopy (EFM) and Scanning Capacitance Microscopy (SCM) provides the unique ability to measure electrical and carrier concentration profiles in semiconductor materials. We provide high and low spring constant mode conductive probes for such usages. | |||
| High Spring Constant | Mid Spring Constant | Low Spring Constant | |
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Frequency 300kHz Spring Constant 40 N/m Thickness 4.0 µm Length 125 µm Width 40 µm |
Frequency 60kHz Spring Constant 3 N/m Thickness 2.5 µm Length 225 µm Width 32 µm |
Frequency 12kHz Spring Constant 0.2 N/m Thickness 2.5 µm Length 450 µm Width 45 µm |
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| For quote or more information please fill out this info request form. (Info Form) | |||