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ACLA-SS |
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ACLA-SS probes are Super-Sharp silicon probes designed for Non-Contact, Tapping Mode, Intermittent Contact, and/or Close Contact applications. These probes have long cantilevers that allow for larger laser clearance, and have Aluminum coating on the reflex side to increase laser signal quality. Our Super Sharp probes yield enhanced resolution images.
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Tip Specifications |
| Material: Silicon |
| Shape: Pyramidal |
| Height (µm): 14-16 |
| Aspect Ratio: >3.5 |
| ROC* (nm): 2 |
| Coating: None |
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* Nominal specification; guaranteed < 5 nm |
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Cantilever Specifications
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Material: Silicon |
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Shape: Rectangular |
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Reflex Coating: Al, 30 nm ± 5 |
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ACLA-SS.pdf
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Parameter |
Nominal Value |
Minimum Value |
Maximum Value |
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Spring Constant (N/m) |
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45 |
20 |
90 |
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190 |
145 |
230 |
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225 |
215 |
235 |
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40 |
35 |
45 |
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8.5 |
8.0 |
9.0 |
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Frequency (kHz) |
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Length (µm) |
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Width (µm) |
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Thickness (µm) |
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Ordering Information: |
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Part Number |
No. of Probes
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Pricing |
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ACLA-SS-10 |
10 |
$672 |
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ACLA-SS-20 |
20 |
$1,235 |
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ACLA-SS-50 |
50 |
$2,655 |
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ACLA-SS-200 |
200 |
$8,957 |
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ACLA-SS-W |
410 - 424 |
$13,674 |
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For further information or to place an order, please contact your
local distributor or contact
Applied NanoStructures directly.
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