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FORTA-SS |
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FORTA-SS probes are Super-Sharp silicon probes designed for Force Modulation applications. These probes have a medium frequency and spring constant that make them ideally suited to Force Modulation Microscopy, and have Aluminum coating on the reflex side to increase laser signal quality. Our Super Sharp probes yield enhanced resolution images.
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Tip Specifications |
| Material: Silicon |
| Shape: Pyramidal |
| Height (µm): 14-16 |
| Aspect Ratio: >3.5 |
| ROC* (nm): 2 |
| Coating: None |
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* Nominal specification; guaranteed < 5 nm |
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Cantilever Specifications
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Material: Silicon |
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Shape: Rectangular |
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Reflex Coating: Al, 30 nm ± 5 |
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FORTA-SS.pdf
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Parameter |
Nominal Value |
Minimum Value |
Maximum Value |
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Spring Constant (N/m) |
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3.0 |
1.2 |
6.4 |
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62 |
47 |
76 |
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225 |
215 |
235 |
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30 |
25 |
35 |
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3.0 |
2.5 |
3.5 |
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Frequency (kHz) |
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Length (µm) |
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Width (µm) |
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Thickness (µm) |
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Ordering Information: |
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Part Number |
No. of Probes
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Pricing |
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FORTA-SS-10 |
10 |
$672 |
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FORTA-SS-20 |
20 |
$1,235 |
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FORTA-SS-50 |
50 |
$2,655 |
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FORTA-SS-200 |
200 |
$8,957 |
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FORTA-SS-W |
410 - 424 |
$13,674 |
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For further information or to place an order, please contact your
local distributor or contact
Applied NanoStructures directly.
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