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SHOCON-SS |
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SHOCON-SS probes are Super-Sharp silicon probes designed for contact mode applications. These probes feature shorter cantilevers, which provide better sensitivity without compromising on spring constant requirements. Our Super Sharp probes yield enhanced resolution images.
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Tip Specifications |
| Material: Silicon |
| Shape: Pyramidal |
| Height (µm): 14-16 |
| Aspect Ratio: >3.5 |
| ROC* (nm): 2 |
| Coating: None |
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* Nominal specification; guaranteed < 5 nm |
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Cantilever Specifications
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Material: Silicon |
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Shape: Rectangular |
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Reflex Coating: None |
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SHOCON-SS.pdf
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Parameter |
Nominal Value |
Minimum Value |
Maximum Value |
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Spring Constant (N/m) |
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0.10 |
0.02 |
0.18 |
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28 |
18 |
38 |
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225 |
215 |
235 |
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43 |
37 |
47 |
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1.0 |
1.5 |
0.5 |
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Frequency (kHz) |
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Length (µm) |
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Width (µm) |
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Thickness (µm) |
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Ordering Information: |
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Part Number |
No. of Probes
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Pricing |
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SHOCON-SS-10 |
10 |
$672 |
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SHOCON-SS-20 |
20 |
$1,235 |
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SHOCON-SS-50 |
50 |
$2,655 |
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SHOCON-SS-200 |
200 |
$8,957 |
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SHOCON-SS-W |
410 - 424 |
$13,674 |
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For further information or to place an order, please contact your
local distributor or contact
Applied NanoStructures directly.
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