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SICON-SS |
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SICON-SS probes are Super-Sharp silicon probes designed for contact mode applications. These probes feature long, thin cantilevers, which allow for a lower spring constant and improved laser clearance. Our Super Sharp probes yield enhanced resolution images.
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Tip Specifications |
| Material: Silicon |
| Shape: Pyramidal |
| Height (µm): 14-16 |
| Aspect Ratio: >3.5 |
| ROC* (nm): 2 |
| Coating: None |
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* Nominal specification; guaranteed < 5 nm |
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Cantilever Specifications
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Material: Silicon |
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Shape: Rectangular |
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Reflex Coating: None |
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SICON-SS.pdf
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Parameter |
Nominal Value |
Minimum Value |
Maximum Value |
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Spring Constant (N/m) |
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0.2 |
0.1 |
0.6 |
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12 |
11 |
18 |
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450 |
440 |
460 |
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40 |
35 |
45 |
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2.5 |
2.0 |
3.0 |
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Frequency (kHz) |
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Length (µm) |
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Width (µm) |
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Thickness (µm) |
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Ordering Information: |
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Part Number |
No. of Probes
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Pricing |
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SICON-SS-10 |
10 |
$672 |
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SICON-SS-20 |
20 |
$1,235 |
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SICON-SS-50 |
50 |
$2,655 |
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SICON-SS-200 |
200 |
$8,957 |
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SICON-SS-W |
410 - 424 |
$13,674 |
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For further information or to place an order, please contact your
local distributor or contact
Applied NanoStructures directly.
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