|
Application |
SPM Probe Model |
Description |
Spring Constant (N/m) |
Resonance Frequency (kHz) |
|
Non-Contact / AC Mode Probes
|
ACT(A) |
Silicon Tapping
Mode Probe |
40 |
300 |
|
ACL(A) |
Long Cantilever
Tapping Mode Probe |
48 |
190 |
|
FORT(A) |
Force Modulation
Mode Probe |
3 |
60 |
|
HYDRA6R-100(G) |
Silicon Nitride
Probe Rectangular Cant. |
0..3 - 0.4 |
66 |
|
HYDRA6V-100(G) |
Silicon Nitride
Probe V- Shape Cantilever |
|
Contact Mode Probes |
SICON(A) |
Silicon Contact
Mode Probe |
0.17 |
13 |
|
SHOCON(A) |
Short Cantilever
Contact Mode Probe |
0.13 |
23 |
|
HYDRA6R-200(G) |
Silicon Nitride
Probe Rectangular Cant. |
0.03 - 0.08 |
17 |
|
HYDRA6V-200(G) |
Silicon Nitride
Probe V- Shape Cantilever |
|
Force Curve Liquid Probes |
HYDRA2R-100(G) |
Nitride
Probe-Rectangular Cantilever |
0.011 - 0.015 |
21 |
|
HYDRA2R-50 (G) |
Nitride
Probe-Rectangular Cantilever |
0.072 |
72 |
|
Electrostatic Force Microscopy
|
ANSCM-PA |
High Spring
Constant EFM Probe |
40 |
300 |
|
ANSCM-PT |
Medium Spring
Constant EFM Probe |
3 |
60 |
|
ANSCM-PC |
Low Spring
Constant EFM Probe |
0.17 |
13 |
|
Magnetic Force Microscopy |
MAGT-LM |
Low Moment MFM Probes |
3 |
60 |
|
MAGT |
Medium Moment MFM Probes |
3 |
60 |
|
MAGT-HM |
High Moment MFM
Probes |
3 |
60 |
|
High Aspect
Ratio Probes |
HART(A)0 |
High Aspect
Ratio Probes – No Tilt Compensation |
40 |
300 |
|
HART(A)3 |
High Aspect
Ratio Probes – 3° Tilt Compensation |
|
HART(A)12 |
High Aspect
Ratio Probes – 12° Tilt Compensation |
|
Force
Calibration |
FCL(A) |
Five Tipless
Cantilever per chip for spring constant calibration |
0.12 - 77 |
14 - 1000 |