Step Height Standards & Characterizers
Step Height Standards are uniquely designed for X,Y, and Z calibration of scanning probe microscopes and profilometers. Our Step Height Standard features are defined in thermally grown silicon dioxide on silicon substrate. A layer of Cr is deposited to harden the surface. Our step height standards are available in several heights.
SHS
Applied NanoStructures' Step Height Standards are uniquely designed for X, Y, and Z calibration of scanning probe microscopes and profilometers. Our Step Height Standard features are defined in thermally grown silicon dioxide on silicon substrate, with a layer of Cr deposited to harden the surface. SHS products are available in heights of 1 µm and 100 nm.