ACCESS™ Probes
AppNano ACCESS™ probes are sharp silicon probes that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging.
Tip Specifications
- Material: Silicon
- Shape: Triangular Pyramid
- Height (µm): 14-16
- Tip side coating: none or Gold
Cantilever Specifications
- Material: Silicon
- Shape: Rectangular
- L x W x T: 3.4 mm x 1.6 mm x 300 um
- Reflex Coating: None or Gold
- Alignment Grooves: YES
Base Specifications:
- Frequency (kHz): 300
- Length (µm): 160
- Spring Constant (N/m): 93
Available models
- ACCESS-EFM™ Probes - Standard Non-Contact/Tapping Mode probe, platinum coated reflex and tip side.
- ACCESS-FM™ Probes - Standard Non-Contact/Tapping Mode probe, uncoated.
- ACCESS-FM-GG™ Probes - Standard Non-Contact/Tapping Mode probe, gold coated reflex and tip side.
- ACCESS-NC™ Probes - Standard Non-Contact/Tapping Mode probe, uncoated.