ACCESS-C™ Probes
AppNano ACCESS-C™ probes are sharp silicon probes for contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging.
Tip Specifications
- Material: Silicon
- Shape: Triangular Pyramid
- Height (µm): 14-16
- Coating: none
- ROC (nm): 6
Cantilever Specifications
- Material: Silicon
- Shape: Rectangular
- Reflex coating: None
- Alignment Grooves: YES
- L x W x T: 3.4 mm x 1.6 mm x 315 um
| Parameter | Nominal Value | Minimum Value | Maximum Value |
|---|---|---|---|
| Spring Constant (N/m) | 0.30 | 0.06 | 0.94 |
| Frequency (kHz) | 16 | 8 | 25 |
| Length (µm) | 450 | 430 | 470 |
| Width (µm) | 49.5 | 49.0 | 50.0 |
| Thickness (µm) | 2.5 | 1.5 | 3.5 |
Ordering Information:
| Part Number | Quantity | Pricing | Order |
|---|---|---|---|
| ACCESS-C-10 | 10 | $418 | |
| ACCESS-C-20 | 20 | $777 | |
| ACCESS-C-50 | 50 | $1580 | |
| ACCESS-C-200 | 200 | $5060 | |
| ACCESS-C-W | 410-424 | $8750 |
For further information or to place an order, please contact your local distributor or contact Applied NanoStructures directly.
©2013 Applied NanoStructures, Inc.