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Applied NanoStructures , Inc.
415 Clyde Ave. Suite 102
Mountain View, CA 94043
Tel: +1 650.988.9880
Fax: +1 408.516.4917
Sales: sales@appnano.com

ACCESS-C™ Probes

AppNano ACCESS-C™ probes are sharp silicon probes for contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging.

Tip Specifications

  • Material: Silicon
  • Shape: Triangular Pyramid
  • Height (µm): 14-16
  • Coating: none
  • ROC (nm): 6

Cantilever Specifications

  • Material: Silicon
  • Shape: Rectangular
  • Reflex coating: None
  • Alignment Grooves: YES
  • L x W x T: 3.4 mm x 1.6 mm x 315 um
ParameterNominal ValueMinimum ValueMaximum Value
Spring Constant (N/m)0.300.060.94
Frequency (kHz)16825
Length (µm)450430470
Width (µm)49.549.050.0
Thickness (µm)2.51.53.5

Ordering Information:

Part NumberQuantityPricing Order
ACCESS-C-1010 $418
ACCESS-C-2020 $777
ACCESS-C-5050 $1580
ACCESS-C-200200 $5060
ACCESS-C-W410-424 $8750

For further information or to place an order, please contact your local distributor or contact Applied NanoStructures directly.