MAGT Series
MAGT probes are silicon probes specially designed for Magnetic Force Microscopy (MFM) applications. Both the reflex and tip sides have a layer of magnetic coating. Our MAGT probes vary in coercitivity and moment to match different MFM requirements.
Base Specifications:
- Length (µm): 225
- Frequency (kHz): 62
- Spring Constant (N/m): 3.0
Available models
- MAGT - Magnetic Force Microscopy (MFM) probe with medium coercitivity and medium moment magnetic coating.
- MAGT-HM - Magnetic Force Microscopy (MFM) probe with medium coercitivity and high moment magnetic material coating.
- MAGT-LM - Magnetic Force Microscopy (MFM) probe with medium coercitivity and low moment magnetic material coating.