Model:  FCL

Type: Force Calibration Cantilever Probes

 

Substrate Specifications

 Material: Single Crystal Silicon, N-type, 0.01 -0.025Ω-cm, Antimony doped

Size ( LxWxT) : 3.4mm X 1.6 mm X 300 µm

   
Cantilever Specifications

Material

Silicon

Shape

Rectangular

Cross-section  

Trapezoidal

No. of cantilevers

1

Front side coating

None

Back side  coating

None

 
 
 
   
Cantilever Parameters  

 

Shape

Frequency ( kHz)

Spring Constant   (N/m)

Thickness    (µm)

Length          (µm)

Width          (µm)

Typ

Min

Max

Typ

Min

Max

Typ

Min

Max

Typ

Min

Max

Typ

Min

Max

A

14

13

16

0.12

0.08

0.18

2.0

1.8

2.2

442

440

445

32

31.5

33

B

60

52

66

0.98

0.7

1.5

2.0

1.8

2.2

218

216

220

32

31.5

33

C

300

260

350

12

8

18

2.0

1.8

2.2

96

94

98

32

31.5

33

D

550

470

650

30

20

45

2.0

1.8

2.2

71

69

73

32

31.5

33

E

1000

860

1200

77

49

118

2.0

1.8

2.2

52

50

54

32

31.5

33

   
Ordering Info

Part Number

Short  Description

Probes / Pk

FCL-5

Tip Less Force Calibration Cantilever Array

5

FCL-5

Tip Less Force Calibration Cantilever Array

10

FCLA-5

Tip Less Force Calibration Cantilever Array with Reflex Coating

5

FCLA-10

Tip Less Force Calibration Cantilever Array with Reflex Coating

10

 

 
Data Sheet  
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