Model :  FORT

Type: Force Modulation Probes

 

Substrate Specifications

 Material: Single Crystal Silicon, N-type, 0.01 -0.025Ω-cm, Antimony doped

Size ( LxWxT) : 3.4mm X 1.6 mm X 300 µm

 

Tip Specifications

Shape

Tetrahedral

Height ( µm)

14 - 16

Radius of Curvature (nm)

Typ

Max

5 - 6

10

Tip offset ( µm)

5 - 20

Aspect Ratio

3:1 - 5:1

Front Plane angle

10° ± 2°

Back Plane Angle

30° ± 2°

Side Angle ( half)

18° ± 2°

Coating

None

 

 
Probe Options

-A

Reflex Coating (Aluminum)

-G

Gold Coating (Back Side)

-GG

Gold Coating (Both Sides)

-SS

Super Sharp Tip

-TL

Tipless

 

   
Cantilever Specifications

Material

Silicon

Shape

Rectangular

Cross-section  

Trapezoidal

No. of cantilevers

1

Front side coating

None

Back side  coating

None

 
 
Cantilever Parameters

 

Typical

Min.

Max

Frequency (kHz)

60

50 70

Spring Const. ( N/m)

3

1 5

Thickness ( µm)

2.5

2.0 3.0

Length  ( µm)

225

215 235

Width  ( µm)

32

27 37
 
   
Ordering Info

Part Number

Short  Description

Probes / Pk

FORT- 10

Force Modulation Probes

10

FORT- 20

Force Modulation Probes

20

FORT- 50

Force Modulation Probes

50

FORT- 200

Force Modulation Probes

200

FORT- W

Force Modulation Probes, Wafer

Minimum 410

 

 
Data Sheet  Sample AFM Image
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