Model :  MAGT-LM

Type: Low Moment Magnetic Force Microscope Probe
 

Substrate Specifications

 Material: Single Crystal Silicon, N-type, 0.01 -0.025Ω-cm, Antimony doped

Size ( LxWxT) : 3.4mm X 1.6 mm X 300 µm

 
Tip Specifications

Shape

Tetrahedral

Height ( µm)

14 - 16

Radius of Curvature (nm)

Typ

Max

25 

40

Tip offset ( µm)

5 - 20

Aspect Ratio

2:1 - 3:1

Front Plane angle

10° ± 2°

Back Plane Angle

30° ± 2°

Side Angle ( half)

18° ± 2°

Coating

Cr-Co,

15 nm ± 5nm

Magnetic Moment (emu)*

10-12 to 10-14

Coercivity ( Oe )*

300 – 3000

 
 
Note
* The values of magnetic moment and coercivity are based on the properties of magnetic film coating. The valued have not been verified by any means. The actual values may be drastically different.

 
   
Cantilever Specifications

Material

Silicon

Shape

Rectangular

Cross-section  

Trapezoidal

No. of cantilevers

1

Front side coating

Cr-Co, 15 nm ± 5nm

Back side  coating

Cr-Co, 15 nm ± 5nm
 
 
Cantilever Parameters

 

Typical

Min.

 Max

Frequency (kHz)

60

 50 70

Spring Const. ( N/m)

3

 1 5

Thickness ( µm)

2.5

 2.0 3.0

Length  ( µm)

225

 215 235

Width  ( µm)

32

 27 37
 
   
Ordering Info

Part Number

Short  Description

Probes / Pk

MAGT-LM- 10

Low Moment MFM Probes

10

MAGT-LM - 20

Low Moment MFM Probes

20

MAGT-LM - 50

Low Moment MFM Probes

50

MAGT-LM - 200

Low Moment MFM Probes

200

MAGT-LM - W

Low Moment MFM Probes, Wafer

Minimum 410

 
 
Data Sheet  Sample AFM Image
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