NANO CHARACTERIZATION AND METROLOGY

In addition to AFM probe production, AppNano offers a variety of nano characterization and metrology services using the state-of-the-art equipment in our facility. Possible sample types for this process include polymers, metallurgical samples, electronic materials, ceramics, and particles and contaminants on various surfaces.

Available services:

  • Atomic Force Microscopy (AFM)
  • Field Emission Scanning Electron Microscopy (FE-SEM)
  • Focused Ion Beam (FIB)
  • Thin film deposition up to 6” substrate

Contact info@appnano.com for more information.

  About

AppNano develops, manufactures, and supplies various nanostructures including both conventional and specialized SPM probes for most applications. We leverage our extensive experience in nanofabrication technology and.... Read More

Tapping™ and Peakforce Tapping™ are Registered Trademarks of Bruker Corp.

  Company Information

Applied NanoStructures , Inc.
415 Clyde Ave. Suite 102
Mountain View, CA 94043

+1 (650) 988-9880

+1 (408) 516-4917

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