In addition to AFM probe production, AppNano offers a variety of nano characterization and metrology services using the state-of-the-art equipment in our facility. Possible sample types for this process include polymers, metallurgical samples, electronic materials, ceramics, and particles and contaminants on various surfaces.
- Atomic Force Microscopy (AFM)
- Field Emission Scanning Electron Microscopy (FE-SEM)
- Focused Ion Beam (FIB)
- Thin film deposition up to 6” substrate
Contact firstname.lastname@example.org for more information.