NANO CHARACTERIZATION AND METROLOGY
In addition to AFM probe production, AppNano offers a variety of nano characterization and metrology services using the state-of-the-art equipment in our facility. Possible sample types for this process include polymers, metallurgical samples, electronic materials, ceramics, and particles and contaminants on various surfaces.
Atomic Force Microscopy (AFM)
Field Emission Scanning Electron Microscopy (FE-SEM)
Focused Ion Beam (FIB)
Thin film deposition up to 6” substrate
Contact firstname.lastname@example.org for more information.