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NANO CHARACTERIZATION AND METROLOGY
In addition to AFM probe production, AppNano offers a variety of nano characterization and metrology services using the state-of-the-art equipment in our facility. Possible sample types for this process include polymers, metallurgical samples, electronic materials, ceramics, and particles and contaminants on various surfaces.
SEM inspection
Available Services
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Atomic Force Microscopy (AFM)
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Field Emission Scanning Electron Microscopy (FE-SEM)
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Focused Ion Beam (FIB)
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Thin film deposition up to 6” substrate
Contact info@appnano.com for more information.
SNOM-C
SNOM-NC
Step Height Standard
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