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NANO CHARACTERIZATION AND METROLOGY

In addition to AFM probe production, AppNano offers a variety of nano characterization and metrology services using the state-of-the-art equipment in our facility. Possible sample types for this process include polymers, metallurgical samples, electronic materials, ceramics, and particles and contaminants on various surfaces.

SEM inspection

Available Services

  • Atomic Force Microscopy (AFM)

  • Field Emission Scanning Electron Microscopy (FE-SEM)

  • Focused Ion Beam (FIB)

  • Thin film deposition up to 6” substrate

​Contact info@appnano.com for more information.

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