ACCESS (TIP VIEW) PROBES

  • Sharp silicon probes that allow a direct visualization of the AFM tip as it engages the sample surface
  • Nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging
  • Several variations to suit different modes of AFM and special applications like EFM
  • Uncoated/gold coated (reflex side) probes are suitable for applications in air/liquid
  • Uncoated/aluminum coated (reflex side) probes are suitable for applications in air
  • Both sides gold coated (GG) probes are recommended for functionalization/non-contact electric force microscopy studies like Electrostatic Force Microscopy/KPFM etc.
  • Platinum-Iridium (Pt-Ir) coated probes are recommended for contact EFM as well as PFM, KPFM etc.,
  • Doped Diamond (DD) probes are ideal choice for Contact as well as Tapping™ electrical force microscopy applications like SSRM, PFM, EFM, KPFM etc.

ACCESS-C:

  • Suitable for Contact mode applications
Cantilever Specs. *
k (N/m) 0.3
f (kHz) 16
Length (μm) 450
Width (μm) 49
Thickness (μm) 2.5
Coating (reflex side) None/Al
Special option Au
Tip specs. *
ROC (nm) <10
Height (μm) 14-16
Shape Triangular
Coating Uncoated
ACCESS-C Tipview contact mode probe

ACCESS-FM:

  • Optimized for Force modulation mode imaging applications
Cantilever Specs. *
k (N/m) 2.7
f (kHz) 60
Length (μm) 245
Width (μm) 52
Thickness (μm) 2.8
Coating (reflex side) None/Al
Special option Au (reflex side)
Tip specs. *
ROC (nm) <10
Height (μm) 14-16
Shape Triangular
Coating Uncoated
Special option Au coating(GG)
ACCESS-NC Tipview Tapping/Noncontact mode probe

ACCESS-NC:

  • Is designed for Tapping™/Non-contact mode applications
Cantilever Specs. *
k (N/m) 113
f (kHz) 330
Length (μm) 150
Width (μm) 54
Thickness (μm) 5.5
Coating (reflex side) Al, None
Special option Au (reflex side)
Tip specs. *
ROC (nm) <10
Height (μm) 14-16
Shape Triangular
Coating Uncoated
Special option Au coating (GG)
ACCESS-FM Tipview Force Modulation mode Probe

ACCESS-EFM:

  • Series of probes coated with platinum-iridium (Pt-Ir) on different cantilevers for contact, force modulation and Tapping™/Non-contact mode EFM applications.
Cantilever Specs. *
k (N/m) 2.7
f (kHz) 60
Length (μm) 245
Width (μm) 52
Thickness (µm) 2.8
Coating Pt-Ir
Tip specs. *
ROC (nm) <10
Height (μm) 14-16
Shape Triangular
Coating Pt-Ir
ACCESS-EFM PtIr coated Tipview EFM probe

ACCESS-FM-GG:

  • Gold coated probes with excellent conductivity and chemical stability, designed for non-contact electrical studies like EFM, KPFM etc.
Cantilever Specs. *
k (N/m) 2.7
f (kHz) 60
Length (μm) 245
Width (μm) 52
Thickness (µm) 2.8
Coating Au
Tip specs. *
ROC (nm) 30
Height (μm) 14-16
Shape Triangular
Coating Au
ACCESS-FM-GG Gold coated Tipview EFM probe

ACCESS-NC-GG:

  • Gold coated probe on Tapping/Non-contact mode cantilever for non-contact electrical studies like EFM, KPFM etc.
Cantilever Specs. *
k (N/m) 113
f (kHz) 330
Length (μm) 150
Width (μm) 54
Thickness (µm) 5.5
Coating Au
Tip specs. *
ROC (nm) 30
Height (μm) 14-16
Shape Triangular
Coating Au
ACCESS-NC-GG Gold coated Tipview EFM probe

DD-ACCESS-NC-A:

  • Doped diamond film on a stiff cantilever with tip view probe
  • For hard contact EFM studies like SSRM as well as other Contact/Tapping or Non-contact EFM techniques like C-AFM, TUNA, SCM, PFM, electrostatic force microscopy, KPFM, etc.
Cantilever Specs. *
k (N/m) 93
f (kHz) 320
Length (μm) 150
Width (μm) 54
Thickness (µm) 5.5
Coating Al
Tip specs. *
ROC (nm) 100-300
Height (μm) 14-16
Shape Triangular
Coating Doped Diamond
DD-ACCESS-NC-A doped diamond Tipview EFM probe

ACCESS-UHF:

  • Suitable for Contact mode applications

Specially designed for high-resolution, ultra-high frequency scanning with tip view applications

Cantilever Specs. *
k (N/m) 115
f (kHz) 1100
Length (μm) 55
Width (μm) 26
Thickness (µm) 5.5
Coating None/Al
Tip specs. *
ROC (nm) 6
Height (μm) 8-12
Shape Triangular
Coating None
ACCESS-UHF Ultra fast scanning Tipview AFM Probe
* - Nominal values

  About

AppNano develops, manufactures, and supplies various nanostructures including both conventional and specialized SPM probes for most applications. We leverage our extensive experience in nanofabrication technology and.... Read More

Tapping™ and Peakforce Tapping™ are Registered Trademarks of Bruker Corp.

  Company Information

Applied NanoStructures , Inc.
415 Clyde Ave. Suite 102
Mountain View, CA 94043

+1 (650) 988-9880

+1 (408) 516-4917

Contact Us