HIGH ASPECT RATIO TIPS (HART)

HART probes are used for deep trench metrology applications. Different SPM/AFM manufacturer’s use different mounting angles for the probe, AppNano would provide different mounting angles to compensate for the tilt so that the spike is perpendicular to the surface for deep trench metrology applications. We can also make custom HART probes to meet specific requirements, please contact us for your custom requirements.

STEPS to choose a specific HART probe:

1 Choose tilt compensation:

0°    3°    12° 

2 Choose spike length (µm):

  2    4    6 

 

3 Choose coating options (Reflex side):

None    Al 

4 Choose # probes per box (Standard sizes):

5/box     50/box 

 

Your part number is:

 

  About

AppNano develops, manufactures, and supplies various nanostructures including both conventional and specialized SPM probes for most applications. We leverage our extensive experience in nanofabrication technology and.... Read More

Tapping™ and Peakforce Tapping™ are Registered Trademarks of Bruker Corp.

  Company Information

Applied NanoStructures , Inc.
415 Clyde Ave. Suite 102
Mountain View, CA 94043

+1 (650) 988-9880

+1 (408) 516-4917

Contact Us