SILICON PROBES

  • AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal silicon
  • Our well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpness
  • We have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market

Tapping mode AFM probes TAPPING MODE PROBES

ACL Series:

  • Designed for Tapping™/Non-contact mode applications
  • Features long, thick and wide cantilever for greater laser clearance
  • Available with different tip and cantilever options for different applications
ACL- Long Tapping mode AFM probe
Cantilever Specs. *
k (N/m) 58
f (kHz) 190
Length (μm) 225
Width (μm) 40
Thickness (µm) 7.8
Coating (reflex side)
  • Al
  • Au
  • None
Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Au coating (GG) (GG)
  • Super Sharp (SS)
  • Tipless (TL)
  • None

ACST Series:

  • Designed for soft Tapping™/Non-contact mode applications
  • Features reasonably soft and mid-range resonance frequency cantilever
  • Available with different tip and cantilever options for different applications
ACST- Soft Tapping Mode AFM Probe
Cantilever Specs. *
k (N/m) 7.8
f (kHz) 150
Length (μm) 150
Width (μm) 28
Thickness (µm) 3
Coating (reflex side)
  • Al
  • Au
  • None
Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Uncoated
  • Au coating (GG)
  • Super Sharp (SS)
  • Tipless (TL)

ACT series:

  • Short and stiff cantilever with high resonance frequency for high speed scanning of hard samples in Tapping™/Non-contact modes
  • Available with different tip and cantilever options for variety of applications
ACT- Hard Tapping mode AFM probe
Cantilever Specs. *
k (N/m) 37
f (kHz) 300
Length (μm) 125
Width (μm) 30
Thickness (µm) 4
Coating (reflex side)
  • Al
  • Au
  • None
Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Au coating (GG)
  • Ball tip
  • Doped Diamond
  • Plateau (PTU)
  • Super Sharp (SS)
  • Tipless (TL)
  • None

Force Modulation AFM Probes FORCE MODULATION PROBES

FORT series:

  • Features medium spring constant and frequency cantilevers for force modulation mode
  • FORT probes are specially designed for this mode
  • A variety of tip and cantilever options available for different microscopy applications
FORT AFM Probes
Cantilever Specs. *
k (N/m) 1.6
f (kHz) 61
Length (μm) 225
Width (μm) 27
Thickness (µm) 2.7
Coating (reflex side)
  • Al
  • Au
  • None
Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Au coating (GG)
  • Ball tip
  • Doped Diamond
  • Plateau (PTU)
  • Super Sharp (SS)
  • Tipless (TL)
  • None

Contact Mode AFM Probes CONTACT MODE PROBES

SHOCON series:

  • Soft and short (high sensitivity) cantilever for contact mode applications
  • Available with different tip and cantilever options for imaging in air or liquid media
SHOCON- Short Contact Mode AFM Probe
Cantilever Specs. *
k (N/m) 0.14
f (kHz) 21
Length (μm) 225
Width (μm) 46
Thickness (µm) 1
Coating (reflex side)
  • Al
  • Au
  • None
Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Au coating (GG)
  • Super Sharp (SS)
  • Tipless (TL)
  • None

SICON series:

  • Features long and soft cantilever for contact mode applications
  • Long cantilever provides better laser clearance and low spring constant
  • A variety of tip and cantilever options available for different contact mode applications
SICON- Long Contact Mode AFM Probe
Cantilever Specs. *
k (N/m) 0.29
f (kHz) 15
Length (μm) 450
Width (μm) 49
Thickness (µm) 1
Coating (reflex side)
  • Al
  • Au
  • None
Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Au coating (GG)
  • Ball tip
  • Doped Diamond
  • Plateau (PTU)
  • Super Sharp (SS)
  • Tipless (TL)
  • None

Super Sharp (SS)- High Resolution AFM Probes SUPER SHARP (SS) SERIES

Super Sharp (SS) series:

  • Super sharp tip (ROC: 1-2 nm) option available on all our silicon probes
  • Specially fabricated for super resolution imaging
  • Available with different coating options for imaging in air/liquid media
Supersharp AFM probe
Cantilever choices Available on all standard silicon probes like ACL, ACT, ACST, FORT, SICON and SHOCO
Coating (reflex side)
  • Al
  • None
Special options
  • Au/Pt coating (reflex side)

Tipless (TL) series probes TIP LESS (TL) SERIES

Tipless (TL) series:

  • Available on all our silicon and silicon nitride probes for custom applications
  • Available with different coating options for applications in air/liquid media
Tipless probe
Cantilever choices Available on all standard silicon and silicon nitride probes like ACL, ACST, ACT, FORT, SHOCON, SICON and HYDRA series.
Coating (reflex side)
  • Al
  • Au
  • None
Special options
  • Au (Both sides)
  • Pt (Both sides)
* - Nominal values

  About

AppNano develops, manufactures, and supplies various nanostructures including both conventional and specialized SPM probes for most applications. We leverage our extensive experience in nanofabrication technology and.... Read More

Tapping™ and Peakforce Tapping™ are Registered Trademarks of Bruker Corp.

  Company Information

Applied NanoStructures , Inc.
415 Clyde Ave. Suite 102
Mountain View, CA 94043

+1 (650) 988-9880

+1 (408) 516-4917

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