SPM Probes
Both cantilever & tip are Si
SiN cantilever with Si or SiN tip
Allows direct view of the tip as it images the sample
Conductive probes for EFM, MFM
High Aspect Ratio Tip (HART)
- Different spike length options (1/2/4/6 µm)
- Different tilt angle compensation (0/3/12°)
Deep trench metrology
STM Products
AppNano also offers high quality STM probes and STM tip etcher.
About
AppNano develops, manufactures, and supplies various nanostructures including both conventional and specialized SPM probes for most applications. We leverage our extensive experience in nanofabrication technology and.... Read More
Tapping™ and Peakforce Tapping™ are Registered Trademarks of Bruker Corp.
Company Information
Applied NanoStructures , Inc.
415 Clyde Ave. Suite 102
Mountain View, CA 94043