CALIBRATION STANDARDS & TEST SAMPLES
AppNano offers:
- Step Height Standard (SHS)
- Electric Force Microscopy (EFM) Test Sample
- VertiSense™ Thermal Test Sample
- VertiSense™ Thermal Calibration Module
- Force Calibration Levers (FCL) to determine spring constant
STEP HEIGHT STANDARD (SHS)
Our multipurpose Nanuler Calibration Standard is designed for calibration of AFM, SEM, Optical and Mechanical Profilers. Features include step heights, lines, grids, magnification box and spot measurement structures of different pitch. The features are etched into SiO₂ and Si and are optionally available with metal coating for improved reflectivity and reduced static charge.
| Step height standard features | |
|---|---|
| SiO₂ step options (nm) | 100/200/500/1000 |
| Si step options (µm) | 5/10/25 |
| Metal coating | Cr coating (optional) |
| Die size (mm) | 8.0x8.2x0.5 |
| Traceability | NIST (optional) |
| Mounting options | Quartz/Metal disc |
| Packaging options | Available |
Please visit NANULER: http://nanuler.com/products/sh-standards/overview for more details
ELECTRIC FORCE MICROSCOPY (EFM) TEST SAMPLE
- EFM test sample is designed to use as a reference to study the surface electric properties using AFM
- Sample contains two micro comb shaped structures connected with thin metal pads (30 nm Cr)
- Thin pads extended to thick metal pads for wire bonding for applying external bias/grounding
| Specifications | |
|---|---|
| Structure | Two 30 nm Cr metal micro comb shaped electrodes on Si/SiO₂ or Quartz substrate |
| Metal comb area | 0.5x1 mm, pitch 6 μm (Cr 3 μm + space 3 μm) |
| Bonding pads | Thick metal pad (for wire bonding) |
| Die size | 6x6 mm |
| Mounting (options) | Chip is mounted on a small printed circuit board (PCB) which connects bias cables. The PCB is mounted on 15mm metal disk. |
Please visit NANULER: http://nanuler.com/products/2015-10-04-20-46-56 for more details
VertiSense™ Scanning Thermal Microscopy (SThM) Test Sample
- A micro heater fabricated on a silicon chip to qualify VertiSense™ thermal module functionality
- It comes with a battery pack to supply power to the heater
- Micro heater size is about 5 µmx10 µm
- The features are etched into SiO₂ and Si
- Hot spot of the micro heater is capable of reaching up to 80 °C
VERTISENSE™ THERMAL CALIBRATION MODULE
- Used to calibrate VertiSense™ Thermal Probes to accurately measure temperatures
- Can also be used to heat the samples for AFM studies
- Consists of a micro heater integrated with K-type thermocouple
- PID controller maintains the heater temperature with feedback from the thermocouple
- VertiSense™ App guides the thermal calibration procedure on the controller
| Specifications | |
| Heater Assembly | |
|---|---|
| Size | Ø 20 mm, 12 mm tall |
| Material | Ceramic |
| Max. Temp | Up to 200 °C |
| Thermocouple | K-type |
| Controller | |
| Input voltage | 110 V-220 V |
| Current | 2.5 A |
FORCE CALIBRATION CANTILEVERS
- We provide a five cantilever chip for calibrating the spring constant of AFM probes
- They are available in with or without gold coating
About
AppNano develops, manufactures, and supplies various nanostructures including both conventional and specialized SPM probes for most applications. We leverage our extensive experience in nanofabrication technology and.... Read More
Tapping™ and Peakforce Tapping™ are Registered Trademarks of Bruker Corp.
Company Information
Applied NanoStructures , Inc.
415 Clyde Ave. Suite 102
Mountain View, CA 94043