Breakthrough in SThM was achieved through innovative probe design
  • Silicon cantilever with hollow SiO₂ tip integrated with 50 nm thermocouple at the apex of the tip
  • Thermal isolation of the sensor allows accurate measurement of sample temperatures- 0.01 °C sensitivity
  • Choice of materials and probe design allow measuring high temperatures- up to 700 °C
  • Two types of VTP probes:
    • VTP-200 for Tapping™/Peak Force Tapping™/Contact
    • VTP-500 for Contact mode
  • Design also allows imaging in temperature mapping mode (TMM) or conductivity mapping mode (CMM) by changing the position of AFM laser on the cantilever
  • Probes are pre-mounted on adapter boards specific to AFM systems
Parameter Nominal value
VTP-200 VTP-500
k (N/m) 9.9 0.63
f (kHz) 107 17
Length (µm) 200 500
Width (µm) 50 50
Thickness (µm) 3.5 3.5
Height (µm) 16 16
SThM Thermal Probe- VTP
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For further information or to place an order, please contact your local distributor or contact AppNano directly.


AppNano develops, manufactures, and supplies various nanostructures including both conventional and specialized SPM probes for most applications. We leverage our extensive experience in nanofabrication technology and.... Read More

Tapping™ and Peakforce Tapping™ are Registered Trademarks of Bruker Corp.

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