A symphony of silicon! This close-up showcases the intricate array of AFM chips meticulously etched onto a single wafer, ready to be born into the world of nanotechnology.
This close-up view unveils a wafer teeming with potential AFM chips. Each tiny rectangle holds the power to image and manipulate the world at the atomic level.
Step Height Standards (SHS) are designed for X, Y, and Z calibration of scanning probe microscopes and profilometers. Our Step Height Standard features are available in two heights and are defined in thermally grown silicon dioxide on silicon substrate. A layer of Cr is deposited on the standard model to harden the surface.
A symphony of silicon! This close-up showcases the intricate array of AFM chips meticulously etched onto a single wafer, ready to be born into the world of nanotechnology.
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VertiSense™
VertiSense™ Module
Revolutionize your nanoscale thermal analysis with the award-winning VertiSense™ SThM module. This versatile plug-in integrates with most AFMs, offering unmatched ease of use. VertiSense™ boasts exceptional thermal resolution and sensitivity, allowing you to measure temperatures as low as -40 °C and as high as 700 °C with pinpoint accuracy. Explore various material properties with temperature and conductivity mapping modes, all under your control with the intuitive Bluetooth® wireless interface. Unveiling the thermal secrets of your samples has never been easier.
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