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High Aspect Ratio Tip (HART)

  • AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal silicon

  • Our well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpness

  • We have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market

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SNOM-C

SNOM-NC

Step Height Standard

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