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Applied NanoStructures, Inc.
Step Height Standard
High Aspect Ratio Tip (HART)
AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal silicon
Our well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpness
We have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market